Aehr Test Systems (AEHR)

US — Technology Sector
Peers: ACLS  INTT  LRCX  PLAB  INDI  ALGM  SMCI  MRIN 

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Key Metrics & Ratings

  • symbol AEHR
  • Rev/Share 1.9773
  • Book/Share 4.12
  • PB 3.3641
  • Debt/Equity 0.0881
  • CurrentRatio 5.6771
  • ROIC -0.0328

 

  • MktCap 412631604.0
  • FreeCF/Share -0.4155
  • PFCF -33.2982
  • PE -105.7153
  • Debt/Assets 0.0729
  • DivYield 0
  • ROE -0.0317

 

  • Rating C
  • Score 2
  • Recommendation Sell
  • P/E Score 1
  • DCF Score 1
  • P/B Score 3
  • D/E Score 3

Recent Analyst Ratings

Type Ticker Analyst Firm Previous Rating Current Rating Previous Price Target Current Price Target Date
No ratings available.

News

About Aehr Test Systems (AEHR)

  • IPO Date 1997-08-15
  • Website https://www.aehr.com
  • Industry Semiconductors
  • CEO Gayn Erickson
  • Employees 115

Aehr Test Systems provides test systems for burning-in and testing logic, optical, and memory integrated circuits worldwide. It offers products, such as the ABTS and FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX-XP WaferPak Contactor, FOX DiePak Carrier, and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices, as well as various common types of memory devices. The FOX-XP and FOX-NP systems are wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a single-wafer compact test and reliability verification solution for logic, memory, and photonic devices. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform final test and burn-in of bare die and modules. Aehr Test Systems was incorporated in 1977 and is headquartered in Fremont, California.